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KMID : 1102020160460030117
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Applied Microscopy
2016 Volume.46 No. 3 p.117 ~ p.126
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A Brief Overview of Atom Probe Tomography Research
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Gault Baptiste
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Abstract
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Atom probe tomography (APT) has been fast rising in prominence over the past decade as a key tool for nanoscale analytical characterization of a range of materials systems. APT provides three-dimensional mapping of the atom distribution in a small volume of solid material. The technique has evolved, with the incorporation of laser pulsing capabilities, and, combined with progress in specimen preparation, APT is now able to analyse a very range of materials, beyond metals and alloys that used to be its core applications. The present article aims to provide an overview of the technique, providing a brief historical perspective, discussing recent progress leading to the state-of-the-art, some perspectives on its evolution, with targeted examples of applications.
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KEYWORD
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Atom probe tomography, Field evaporation, Materials characterization, Microscopy, Nanoscale
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